Theoretical formulation of amorphous radial distribution function based on wavelet transformation

Deriyan Senjaya, Adri Supardi, Andi Zaidan

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Atomic structure is an important parameter to analyze material physical properties, but investigating the atomic structure is not simple task, especially for disordered structure like amorphous material. Radial Distribution Function (RDF) calculation from experimental X-Ray Diffraction (XRD) data is generally chosen to investigate the disordered structure since RDF can count the number of atoms on each radial distance from arbitrary reference atom. However, when the X-Ray source is below 8 keV (short maximum wave vector q 8 Å-1), XRD data which uses Fourier Transformation (FT) will have low resolution. Therefore, we propose RDF calculation with Wavelet Transformation (WT) from our original wavelet function that was theoretically constructed using simple quantum model of interatomic bonding and semi-empirical method. Amorphous (Ge0.25Se0.75) and Agx(Ge0.25Se0.75)100-x with x = {5, 10, 15, 20, 25} were used as the validity check to compare the two RDF results from our model and the experimental XRD data. The comparison of the first and second peaks in our model and the experimental data indicates the minor error of our model approximately on 2.44% to 10.16%. This error range confirms the promising capability of our model to predict the atomic structure of disordered material like amorphous.

Original languageEnglish
Title of host publication2nd International Conference on Physical Instrumentation and Advanced Materials 2019
EditorsHerri Trilaksana, Sulaiman Wadi Harun, Cameron Shearer, Moh Yasin
PublisherAmerican Institute of Physics Inc.
ISBN (Electronic)9780735440562
DOIs
Publication statusPublished - 9 Dec 2020
Event2nd International Conference on Physical Instrumentation and Advanced Materials, ICPIAM 2019 - Surabaya, Indonesia
Duration: 22 Oct 2019 → …

Publication series

NameAIP Conference Proceedings
Volume2314
ISSN (Print)0094-243X
ISSN (Electronic)1551-7616

Conference

Conference2nd International Conference on Physical Instrumentation and Advanced Materials, ICPIAM 2019
Country/TerritoryIndonesia
CitySurabaya
Period22/10/19 → …

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